Calculation of the electrical parameters from 3D visualisation data of non-disassembled contact interfaces

Constantinos Roussos, Jonathan Swingler

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Electrical contact is an essential factor that should be considered to achieve better performance and long term reliability for the design of devices. In this work, an electrical contact interface is visualized as a 3D Contact Map using X-Ray Computed Tomography (CT) which acquires 3D views of the sample keeping the features intact. The 3D Contact Map contains information on where the electrical contact spots in a 3D surface profile are located with each voxel relating to 5 μm × 5 μm x 5 μm volume at the interface. Contact analysis techniques are developed and implemented with a suite of tools in Matlab in order to calculate electrical parameters (voltage, current, resistance) of each contact spot and contact asperity located between the conductors of a single pole switch rated at 16A AC.

Original languageEnglish
Title of host publication2015 IEEE 61st Holm Conference on Electrical Contacts (Holm)
PublisherIEEE
Pages82-89
Number of pages8
ISBN (Print)9781467393416
DOIs
Publication statusPublished - 2015
Event61st IEEE Holm Conference on Electrical Contacts 2015 - San Diego, United States
Duration: 11 Oct 201514 Oct 2015

Conference

Conference61st IEEE Holm Conference on Electrical Contacts 2015
Abbreviated titleHOLM 2015
CountryUnited States
CitySan Diego
Period11/10/1514/10/15

Keywords

  • contact asperities
  • contact map
  • contact resistance
  • contact spots
  • electrical parameters
  • X-Ray CT

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

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  • Cite this

    Roussos, C., & Swingler, J. (2015). Calculation of the electrical parameters from 3D visualisation data of non-disassembled contact interfaces. In 2015 IEEE 61st Holm Conference on Electrical Contacts (Holm) (pp. 82-89). [7355078] IEEE. https://doi.org/10.1109/HOLM.2015.7355078