Original language | English |
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Pages (from-to) | 745-755 |
Number of pages | 11 |
Journal | Microelectronics Journal |
Volume | 27 |
Issue number | 8 |
Publication status | Published - Nov 1996 |
Berger check prediction for concurrent error detection in the Braun array multiplier
Christian Martyn Jones, S. S. Dlay, R. N. G. Naguib
Research output: Contribution to journal › Article › peer-review