Bayesian joint estimation of the multifractality parameter of image patches using gamma Markov Random Field priors

Sebastien Combrexelle, Herwig Wendt, Yoann Altmann, Jean-Yves Tourneret, Stephen McLaughlin, Patrice Abry

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

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Engineering & Materials Science