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B-Spline X-Ray Diffraction Imaging - Rapid non-destructive measurement of die warpage in ball grid array packages
A. Cowley, A. Ivankovic, C. S. Wong, Nick Bennett, A. N. Danilewsky, M. Gonzalez, V. Cherman, B. Vandevelde, I. De Wolf, P. J. McNally
Research output: Contribution to journal › Article › peer-review
5
Citations
(Scopus)