Au/n-ZnSe contacts studied with use of ballistic-electron-emission microscopy

R. Coratger, F. Ajustron, J. Beauvillain, I. M. Dharmadasa, C. J. Blomfield, K. A. Prior, J. Simpson, B. C. Cavenett

Research output: Contribution to journalArticle

Abstract

Ballistic-electron-emission microscopy (BEEM) has been used to study the Schottky-barrier formation at the Au/n-ZnSe interface. Spectroscopy measurements indicate that the Schottky-barrier heights present unusually large variations and range from 1.53 to 2.15 eV. The lowest values are in good agreement with the barrier heights obtained from macroscopic current-voltage (I-V) measurements. The possible reasons for the existence of large Schottky-barrier variations are presented and discussed in this paper. These include the effect of variations of the work function and the behavior of the contact as a metal-insulator- semiconductor structure due to microclusters of different phases at the interface. Contrasts in the BEEM image are also found to follow the gold grain boundaries and are assumed to depend both on the grain orientation and interface quality. © 1995 The American Physical Society.

Original languageEnglish
Pages (from-to)2357-2362
Number of pages6
JournalPhysical Review B: Condensed Matter
Volume51
Issue number4
DOIs
Publication statusPublished - 1995

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ballistics
electron emission
microscopy
MIS (semiconductors)
grain boundaries
gold
electric potential
spectroscopy

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Coratger, R., Ajustron, F., Beauvillain, J., Dharmadasa, I. M., Blomfield, C. J., Prior, K. A., ... Cavenett, B. C. (1995). Au/n-ZnSe contacts studied with use of ballistic-electron-emission microscopy. Physical Review B: Condensed Matter, 51(4), 2357-2362. https://doi.org/10.1103/PhysRevB.51.2357
Coratger, R. ; Ajustron, F. ; Beauvillain, J. ; Dharmadasa, I. M. ; Blomfield, C. J. ; Prior, K. A. ; Simpson, J. ; Cavenett, B. C. / Au/n-ZnSe contacts studied with use of ballistic-electron-emission microscopy. In: Physical Review B: Condensed Matter. 1995 ; Vol. 51, No. 4. pp. 2357-2362.
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Coratger, R, Ajustron, F, Beauvillain, J, Dharmadasa, IM, Blomfield, CJ, Prior, KA, Simpson, J & Cavenett, BC 1995, 'Au/n-ZnSe contacts studied with use of ballistic-electron-emission microscopy', Physical Review B: Condensed Matter, vol. 51, no. 4, pp. 2357-2362. https://doi.org/10.1103/PhysRevB.51.2357

Au/n-ZnSe contacts studied with use of ballistic-electron-emission microscopy. / Coratger, R.; Ajustron, F.; Beauvillain, J.; Dharmadasa, I. M.; Blomfield, C. J.; Prior, K. A.; Simpson, J.; Cavenett, B. C.

In: Physical Review B: Condensed Matter, Vol. 51, No. 4, 1995, p. 2357-2362.

Research output: Contribution to journalArticle

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AU - Coratger, R.

AU - Ajustron, F.

AU - Beauvillain, J.

AU - Dharmadasa, I. M.

AU - Blomfield, C. J.

AU - Prior, K. A.

AU - Simpson, J.

AU - Cavenett, B. C.

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Coratger R, Ajustron F, Beauvillain J, Dharmadasa IM, Blomfield CJ, Prior KA et al. Au/n-ZnSe contacts studied with use of ballistic-electron-emission microscopy. Physical Review B: Condensed Matter. 1995;51(4):2357-2362. https://doi.org/10.1103/PhysRevB.51.2357