Approximate standard errors in semi-parametric models

Iain David Currie, M Durban, C Hackett

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)699-703
Number of pages5
JournalBiometrics
Volume55
Publication statusPublished - 1999

Cite this

Currie, I. D., Durban, M., & Hackett, C. (1999). Approximate standard errors in semi-parametric models. Biometrics, 55, 699-703.
Currie, Iain David ; Durban, M ; Hackett, C. / Approximate standard errors in semi-parametric models. In: Biometrics. 1999 ; Vol. 55. pp. 699-703.
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author = "Currie, {Iain David} and M Durban and C Hackett",
year = "1999",
language = "English",
volume = "55",
pages = "699--703",
journal = "Biometrics",
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publisher = "Wiley-Blackwell",

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Currie, ID, Durban, M & Hackett, C 1999, 'Approximate standard errors in semi-parametric models', Biometrics, vol. 55, pp. 699-703.

Approximate standard errors in semi-parametric models. / Currie, Iain David; Durban, M; Hackett, C.

In: Biometrics, Vol. 55, 1999, p. 699-703.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Approximate standard errors in semi-parametric models

AU - Currie, Iain David

AU - Durban, M

AU - Hackett, C

PY - 1999

Y1 - 1999

M3 - Article

VL - 55

SP - 699

EP - 703

JO - Biometrics

JF - Biometrics

SN - 0006-341X

ER -

Currie ID, Durban M, Hackett C. Approximate standard errors in semi-parametric models. Biometrics. 1999;55:699-703.