Abstract
The use and suitability of synchrotron, polarised ultra-soft X-ray absorption near-edge structure (XANES) spectroscopy, for surface characterisation in realistic thermodynamic conditions is described and illustrated through an examination of the melting characteristics of the surface and subsurface regions of a normal alkane thin film deposited on Si(111).
| Original language | English |
|---|---|
| Pages (from-to) | 67-71 |
| Number of pages | 5 |
| Journal | Journal of Crystal Growth |
| Volume | 166 |
| Issue number | 1-4 |
| Publication status | Published - Sept 1996 |