Application of polarised ultra-soft X-ray absorption near-edge spectroscopy to the characterisation of the structure of molecular interfaces

G. P. Hastie, Joy Johnstone, K. J. Roberts, D. Fischer

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

The use and suitability of synchrotron, polarised ultra-soft X-ray absorption near-edge structure (XANES) spectroscopy, for surface characterisation in realistic thermodynamic conditions is described and illustrated through an examination of the melting characteristics of the surface and subsurface regions of a normal alkane thin film deposited on Si(111).

Original languageEnglish
Pages (from-to)67-71
Number of pages5
JournalJournal of Crystal Growth
Volume166
Issue number1-4
Publication statusPublished - Sep 1996

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