Analysis of chemical vapour deposited diamondfilms by X-ray photoelectron spectroscopy

John Ivor Barrett Wilson, J S Walton, G Beamson

Research output: Contribution to journalArticle

Abstract

X-ray photoelectron spectroscopy (XPS) for elemental and phase analysis of diamond surfaces is reviewed, including both single crystal natural diamond and polycrystalline chemical vapour deposition (CVD) films. The core C1s peaks, plasmon losses and valence band spectra of sp2 graphite are compared with those of sp3diamond, and briefly with mixed sp2/sp3 hard carbon films. Surface reconstructions are reviewed for diamond in the presence of hydrogen or following thermal annealing. Attention is drawn to the destructive effects of argon ion bombardment ‘cleaning’. The synthesis of CVDdiamond, including the initial nucleation process, is described and the significance of hydrogen is explained. Chemical modification of the surface of diamondfilms is discussed, with relevance to sensors and field electron emission. XPSanalysis of (111) polycrystalline films treated by atom beams of N, O, H, Cl is described and the influence of unwanted oxygen is emphasised. For both atom beam and furnace oxidation, the oxygen is incorporated into the (111) diamond surface as bridging C–O–C.
Original languageEnglish
Pages (from-to)183-201
Number of pages19
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume121
Issue number1-3
DOIs
Publication statusPublished - 2001

Fingerprint

Diamond
X ray photoelectron spectroscopy
Vapors
Hydrogen
Oxygen
Atoms
Surface reconstruction
Graphite
Argon
Carbon films
Electron emission
Chemical modification
Ion bombardment
Valence bands
Chemical vapor deposition
Cleaning
Furnaces
Nucleation
Single crystals
Annealing

Cite this

Wilson, John Ivor Barrett ; Walton, J S ; Beamson, G. / Analysis of chemical vapour deposited diamondfilms by X-ray photoelectron spectroscopy. In: Journal of Electron Spectroscopy and Related Phenomena. 2001 ; Vol. 121, No. 1-3. pp. 183-201.
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abstract = "X-ray photoelectron spectroscopy (XPS) for elemental and phase analysis of diamond surfaces is reviewed, including both single crystal natural diamond and polycrystalline chemical vapour deposition (CVD) films. The core C1s peaks, plasmon losses and valence band spectra of sp2 graphite are compared with those of sp3diamond, and briefly with mixed sp2/sp3 hard carbon films. Surface reconstructions are reviewed for diamond in the presence of hydrogen or following thermal annealing. Attention is drawn to the destructive effects of argon ion bombardment ‘cleaning’. The synthesis of CVDdiamond, including the initial nucleation process, is described and the significance of hydrogen is explained. Chemical modification of the surface of diamondfilms is discussed, with relevance to sensors and field electron emission. XPSanalysis of (111) polycrystalline films treated by atom beams of N, O, H, Cl is described and the influence of unwanted oxygen is emphasised. For both atom beam and furnace oxidation, the oxygen is incorporated into the (111) diamond surface as bridging C–O–C.",
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Analysis of chemical vapour deposited diamondfilms by X-ray photoelectron spectroscopy. / Wilson, John Ivor Barrett; Walton, J S ; Beamson, G.

In: Journal of Electron Spectroscopy and Related Phenomena, Vol. 121, No. 1-3, 2001, p. 183-201.

Research output: Contribution to journalArticle

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AU - Wilson, John Ivor Barrett

AU - Walton, J S

AU - Beamson, G

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AB - X-ray photoelectron spectroscopy (XPS) for elemental and phase analysis of diamond surfaces is reviewed, including both single crystal natural diamond and polycrystalline chemical vapour deposition (CVD) films. The core C1s peaks, plasmon losses and valence band spectra of sp2 graphite are compared with those of sp3diamond, and briefly with mixed sp2/sp3 hard carbon films. Surface reconstructions are reviewed for diamond in the presence of hydrogen or following thermal annealing. Attention is drawn to the destructive effects of argon ion bombardment ‘cleaning’. The synthesis of CVDdiamond, including the initial nucleation process, is described and the significance of hydrogen is explained. Chemical modification of the surface of diamondfilms is discussed, with relevance to sensors and field electron emission. XPSanalysis of (111) polycrystalline films treated by atom beams of N, O, H, Cl is described and the influence of unwanted oxygen is emphasised. For both atom beam and furnace oxidation, the oxygen is incorporated into the (111) diamond surface as bridging C–O–C.

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