An in-situ synchrotron X-ray diffraction tomography study of crystallization and preferred crystal orientation in a stirred reactor

S. D. M. Jacques; K. Pile; P. Barnes; X. Lai; K. J. Roberts; Richard A Williams

doi:10.1021/cg0497288

An in-situ synchrotron X-ray diffraction tomography study of crystallization and preferred crystal orientation in a stirred reactor

S. D. M. Jacques, K. Pile, P. Barnes, X. Lai, K. J. Roberts, Richard A Williams

School of Engineering & Physical Sciences

Research output: Contribution to journal › Article › peer-review

19 Citations (Scopus)

Abstract

A new tomographic technique, based on synchrotron X-ray diffraction, has been used to chart polymorphic content and crystallite alignment inside a model pharmaceutical reactor. This reveals complex behavior according to
crystallite shape/size characteristics; in particular, stirring induces pronounced crystal zonation marked by a boundary “alignment band” in which the crystallites adopt a “stand on edge” orientation.

Original language	English
Pages (from-to)	395-397
Number of pages	3
Journal	Crystal Growth and Design
Volume	5
Issue number	2
DOIs	https://doi.org/10.1021/cg0497288
Publication status	Published - 2005

Access to Document

10.1021/cg0497288

http://pubs.acs.org/doi/pdf/10.1021/cg0497288

Cite this

@article{5745f748e730403e9d24a6eb698228a4,

title = "An in-situ synchrotron X-ray diffraction tomography study of crystallization and preferred crystal orientation in a stirred reactor",

abstract = "A new tomographic technique, based on synchrotron X-ray diffraction, has been used to chart polymorphic content and crystallite alignment inside a model pharmaceutical reactor. This reveals complex behavior according tocrystallite shape/size characteristics; in particular, stirring induces pronounced crystal zonation marked by a boundary “alignment band” in which the crystallites adopt a “stand on edge” orientation.",

author = "Jacques, {S. D. M.} and K. Pile and P. Barnes and X. Lai and Roberts, {K. J.} and Williams, {Richard A}",

year = "2005",

doi = "10.1021/cg0497288",

language = "English",

volume = "5",

pages = "395--397",

journal = "Crystal Growth and Design",

issn = "1528-7483",

publisher = "American Chemical Society",

number = "2",

}

TY - JOUR

T1 - An in-situ synchrotron X-ray diffraction tomography study of crystallization and preferred crystal orientation in a stirred reactor

AU - Jacques, S. D. M.

AU - Pile, K.

AU - Barnes, P.

AU - Lai, X.

AU - Roberts, K. J.

AU - Williams, Richard A

PY - 2005

Y1 - 2005

N2 - A new tomographic technique, based on synchrotron X-ray diffraction, has been used to chart polymorphic content and crystallite alignment inside a model pharmaceutical reactor. This reveals complex behavior according tocrystallite shape/size characteristics; in particular, stirring induces pronounced crystal zonation marked by a boundary “alignment band” in which the crystallites adopt a “stand on edge” orientation.

AB - A new tomographic technique, based on synchrotron X-ray diffraction, has been used to chart polymorphic content and crystallite alignment inside a model pharmaceutical reactor. This reveals complex behavior according tocrystallite shape/size characteristics; in particular, stirring induces pronounced crystal zonation marked by a boundary “alignment band” in which the crystallites adopt a “stand on edge” orientation.

U2 - 10.1021/cg0497288

DO - 10.1021/cg0497288

M3 - Article

SN - 1528-7483

VL - 5

SP - 395

EP - 397

JO - Crystal Growth and Design

JF - Crystal Growth and Design

IS - 2

ER -

An in-situ synchrotron X-ray diffraction tomography study of crystallization and preferred crystal orientation in a stirred reactor

Abstract

Access to Document

Fingerprint

Cite this