An in-situ synchrotron X-ray diffraction tomography study of crystallization and preferred crystal orientation in a stirred reactor

S. D. M. Jacques, K. Pile, P. Barnes, X. Lai, K. J. Roberts, Richard A Williams

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

A new tomographic technique, based on synchrotron X-ray diffraction, has been used to chart polymorphic content and crystallite alignment inside a model pharmaceutical reactor. This reveals complex behavior according to
crystallite shape/size characteristics; in particular, stirring induces pronounced crystal zonation marked by a boundary “alignment band” in which the crystallites adopt a “stand on edge” orientation.
Original languageEnglish
Pages (from-to)395-397
Number of pages3
JournalCrystal Growth and Design
Volume5
Issue number2
DOIs
Publication statusPublished - 2005

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