An examination of the structure and melting behaviour of thin film normal alkanes using ultra-soft polarised near-edge X-ray absorption spectroscopy.

K J Roberts; G P Hastie; J Johnstone; D Fisher

An examination of the structure and melting behaviour of thin film normal alkanes using ultra-soft polarised near-edge X-ray absorption spectroscopy.

K J Roberts, G P Hastie, J Johnstone, D Fisher

School of Engineering & Physical Sciences

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	783-791
Number of pages	9
Journal	Journal of the Chemical Society, Faraday Transactions
Volume	92
Publication status	Published - 1996

Cite this

@article{1ba9fbf8c91e4537a6cab85f3e78bfc4,

title = "An examination of the structure and melting behaviour of thin film normal alkanes using ultra-soft polarised near-edge X-ray absorption spectroscopy.",

author = "Roberts, {K J} and Hastie, {G P} and J Johnstone and D Fisher",

year = "1996",

language = "English",

volume = "92",

pages = "783--791",

journal = "Journal of the Chemical Society, Faraday Transactions",

issn = "0956-5000",

publisher = "Royal Society of Chemistry",

}

TY - JOUR

T1 - An examination of the structure and melting behaviour of thin film normal alkanes using ultra-soft polarised near-edge X-ray absorption spectroscopy.

AU - Roberts, K J

AU - Hastie, G P

AU - Johnstone, J

AU - Fisher, D

PY - 1996

Y1 - 1996

M3 - Article

SN - 0956-5000

VL - 92

SP - 783

EP - 791

JO - Journal of the Chemical Society, Faraday Transactions

JF - Journal of the Chemical Society, Faraday Transactions

ER -