An enhanced modulated waveform measurement system for the robust characterization of microwave devices under modulated excitation

M. Akmal, J. Lees, V. Carrubba, Z. Yusoff, S. Woodington, J. Benedikt, P. J. Tasker, S. Ben Smida, K. Morris, M. Beach, J. McGeehan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Citations (Scopus)

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