An electronic speckle pattern interferometer for two-dimensional strain measurement

Andrew John Moore, M Lucas, J R Tyrer

Research output: Contribution to journalArticle

7 Citations (Scopus)
Original languageEnglish
Pages (from-to)1740-1747
Number of pages8
JournalMeasurement Science and Technology
Volume7
Issue number12
Publication statusPublished - 1996

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