All-solid-state microscope-based system for picosecond time-resolved photoluminescence measurements on II-VI semiconductors

G. S. Buller, J. S. Massa, A. C. Walker

Research output: Contribution to journalArticle

Abstract

A novel, entirely solid-state, instrument has been developed for the study of time-resolved photoluminescence in a wide variety of bulk semiconductors, low-dimensional structures, and other materials. This system uses a frequency-doubled GaAlAs diode laser (pulse width 30 ps) as the 415-nm pump source and a silicon single-photon avalanche diode for detection of photoluminescence. The time-correlated single photon counting technique allows measurement of photoluminescence decays in the temporal region of 10 ps to >500 ns with high statistical accuracy. In addition, the combination of a microscope with a small-area detector provides a spatial resolution of <5 µm. This system is currently being used for the measurement of picosecond time-resolved photoluminescence from II-VI semiconductors.

Original languageEnglish
Pages (from-to)2994-2998
Number of pages5
JournalReview of Scientific Instruments
Volume63
Issue number5
DOIs
Publication statusPublished - 1992

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microscopes
solid state
photoluminescence
avalanche diodes
photons
counting
pulse duration
spatial resolution
semiconductor lasers
pumps
detectors
silicon
decay

Cite this

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abstract = "A novel, entirely solid-state, instrument has been developed for the study of time-resolved photoluminescence in a wide variety of bulk semiconductors, low-dimensional structures, and other materials. This system uses a frequency-doubled GaAlAs diode laser (pulse width 30 ps) as the 415-nm pump source and a silicon single-photon avalanche diode for detection of photoluminescence. The time-correlated single photon counting technique allows measurement of photoluminescence decays in the temporal region of 10 ps to >500 ns with high statistical accuracy. In addition, the combination of a microscope with a small-area detector provides a spatial resolution of <5 µm. This system is currently being used for the measurement of picosecond time-resolved photoluminescence from II-VI semiconductors.",
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All-solid-state microscope-based system for picosecond time-resolved photoluminescence measurements on II-VI semiconductors. / Buller, G. S.; Massa, J. S.; Walker, A. C.

In: Review of Scientific Instruments, Vol. 63, No. 5, 1992, p. 2994-2998.

Research output: Contribution to journalArticle

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