Advanced REACH tool: a Bayesian model for occupational exposure assessment

Kevin McNally*, Nicholas Warren, Wouter Fransman, Rinke Klein Entink, Jody Schinkel, Martie Van Tongeren, John W. Cherrie, Hans Kromhout, Thomas Schneider, Erik Tielemans

*Corresponding author for this work

    Research output: Contribution to journal › Article › peer-review

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