Adhesion Measurements of Epitaxially Lifted MBE-Grown ZnSe

N. Mavridi; Jingxuan Zhu; Nirosh Meckamalil Eldose; Kevin Alan Prior; Richard T. Moug

doi:10.1007/s11664-018-6372-9

Adhesion Measurements of Epitaxially Lifted MBE-Grown ZnSe

N. Mavridi^*, Jingxuan Zhu, Nirosh Meckamalil Eldose, Kevin Alan Prior, Richard T. Moug

^*Corresponding author for this work

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Abstract

ZnSe layers grown by molecular beam epitaxy (MBE), after processing by epitaxial lift-off, have been analyzed using fracture mechanics and thin-film interference to determine their adhesion properties on two different substrates, viz. ZnSe and glass, yielding adhesion energy of 270 ± 60 mJ m⁻² and 34 ± 4 mJ m⁻², respectively. These values are considerably larger than if only van der Waals forces were present and imply that adhesion arises from chemical bonding.

Original language	English
Pages (from-to)	4394-4398
Number of pages	5
Journal	Journal of Electronic Materials
Volume	47
Issue number	8
Early online date	22 May 2018
DOIs	https://doi.org/10.1007/s11664-018-6372-9
Publication status	Published - Aug 2018

Keywords

bonding energy
Epitaxial lift-off
II–VI
Se cap
stacking
van der Waals

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering
Materials Chemistry

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title = "Adhesion Measurements of Epitaxially Lifted MBE-Grown ZnSe",

abstract = "ZnSe layers grown by molecular beam epitaxy (MBE), after processing by epitaxial lift-off, have been analyzed using fracture mechanics and thin-film interference to determine their adhesion properties on two different substrates, viz. ZnSe and glass, yielding adhesion energy of 270 ± 60 mJ m−2 and 34 ± 4 mJ m−2, respectively. These values are considerably larger than if only van der Waals forces were present and imply that adhesion arises from chemical bonding.",

keywords = "bonding energy, Epitaxial lift-off, II–VI, Se cap, stacking, van der Waals",

author = "N. Mavridi and Jingxuan Zhu and {Meckamalil Eldose}, Nirosh and Prior, {Kevin Alan} and Moug, {Richard T.}",

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AU - Meckamalil Eldose, Nirosh

AU - Prior, Kevin Alan

AU - Moug, Richard T.

PY - 2018/8

Y1 - 2018/8

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AB - ZnSe layers grown by molecular beam epitaxy (MBE), after processing by epitaxial lift-off, have been analyzed using fracture mechanics and thin-film interference to determine their adhesion properties on two different substrates, viz. ZnSe and glass, yielding adhesion energy of 270 ± 60 mJ m−2 and 34 ± 4 mJ m−2, respectively. These values are considerably larger than if only van der Waals forces were present and imply that adhesion arises from chemical bonding.

KW - bonding energy

KW - Epitaxial lift-off

KW - II–VI

KW - Se cap

KW - stacking

KW - van der Waals

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JF - Journal of Electronic Materials

IS - 8

ER -

Adhesion Measurements of Epitaxially Lifted MBE-Grown ZnSe

Abstract

Keywords

ASJC Scopus subject areas

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