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Aberration analysis based on pinhole-z-scan method near the focal point of refractive systems
Pablo Castro-Marín, Jesús Garduño-Mejía, Martha Rosete-Aguilar, Neil C. Bruce, Derryck Telford Reid, Carl Farrell, Gabriel E. Sandoval-Romero
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
2
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