Aberration analysis based on pinhole-z-scan method near the focal point of refractive systems

Pablo Castro-Marín, Jesús Garduño-Mejía, Martha Rosete-Aguilar, Neil C. Bruce, Derryck Telford Reid, Carl Farrell, Gabriel E. Sandoval-Romero

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)
41 Downloads (Pure)

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