Aberration analysis based on pinhole-z-scan method near the focal point of refractive systems

Pablo Castro-Marín, Jesús Garduño-Mejía, Martha Rosete-Aguilar, Neil C. Bruce, Derryck Telford Reid, Carl Farrell, Gabriel E. Sandoval-Romero

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)
75 Downloads (Pure)


In this work we present a method used to study the spherical and chromatic aberrations contribution near the focal point of a refractive optical system. The actual focal position is measured by scanning a pinhole attached on the front of a power detector, which are scanned along the optical axis using a motorized stage with 1 μm resolution. Spherical aberration contribution was analyzed by changing the pupil aperture, by modifying the size of the input iris diaphragm and for each case, measuring the actual laser power vs the detector position. Chromatic aberration was analyzed by performing the same procedure but in this case we used an ultra-broad-band femtosecond laser. The results between ML and CW operation were compare. Experimental results are presented.

Original languageEnglish
Title of host publicationOptical Modeling and Performance Predictions VIII
EditorsMark A. Kahan, Marie B. Levine-West
ISBN (Electronic)9781510602984
ISBN (Print)9781510602977
Publication statusPublished - 27 Sept 2016
EventOptical Modeling and Performance Predictions VIII - San Diego, United States
Duration: 31 Aug 20161 Sept 2016

Publication series

NameProceedings of SPIE
ISSN (Print)0277-786X


ConferenceOptical Modeling and Performance Predictions VIII
Country/TerritoryUnited States
CitySan Diego


  • Femtosecond pulses
  • Group and phase focusing
  • Spherical and chromatic aberrations

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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