A Virtual CMM Inspection Tool for Capturing Planning Strategies

Dimitrios Anagnostakis, James Millar Ritchie, Theodore Lim, Raymond Sung, Rick Dewar

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)


One of the most challenging tasks throughout the development and manufacturing of a product is the capturing and formalization of engineering knowledge and expertise. In the past, many researchers have successfully proposed different techniques for capturing knowledge during the design, process and assembly planning of a product. However, few efforts have focused on applying knowledge capture to the task of product verification for Coordinate Measuring Machine (CMM) inspection; most of these are manual, obtrusive for the user and time consuming since the main sources of knowledge come from
documentation such as handbooks, guides or interview transcripts. This paper describes a tool for the automated logging of a planner’s actions while carrying out an inspection planning task in a virtual CMM measurement environment. The tool involves a combination of 3D motion tracking and a postprocessor to decipher the context strategy in the form of an inspection plan. Various representations of a captured strategy will benefit CMM operators by providing them a tool for: understanding planning strategies, better training methods for
inexperienced users and producing more efficient part programs in a shorter time.
Original languageEnglish
Title of host publicationASME 2017 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
PublisherAmerican Society of Mechanical Engineers
Number of pages10
ISBN (Print)9780791858110
Publication statusPublished - 3 Nov 2017
Event37th Computers and Information in Engineering Conference - Cleveland, United States
Duration: 6 Aug 20179 Aug 2017


Conference37th Computers and Information in Engineering Conference
Country/TerritoryUnited States


  • CMM
  • virtual inspection planning
  • VR
  • measurement strategies
  • computer-aided metrology


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