Abstract
It is frequently documented that concurrent shifts in the mean and dispersion of a process quality characteristic carry serious consequences to a manufacturing enterprise. It is, therefore, crucial to consider the detection ability of a control scheme when monitoring simultaneous changes in the process mean and dispersion. In this article, we conduct a thorough study on the detection performances of two dynamic control schemes, i.e., the variable-sample-size weighted-loss cumulative sum (VSS WLC) chart and the absolute-value sequential probability ratio test (ABS-SPRT) chart. This article reveals that the optimal ABS-SPRT chart outperforms the optimal VSS WLC chart in terms of the average extra quadratic loss and the average time to signal over a range of shift sizes. For small process shifts, the optimal VSS WLC chart is a slightly better performer than the optimal ABSSPRT chart in terms of the average number of observations to signal. However, for moderate and large process shifts, the optimal ABS-SPRT chart remains the most powerful scheme in all aspects. The ABS-SPRT chart is also favored due to its smaller long-run expected sample size compared to the VSS WLC chart, making it extremely promising in many industrial applications.
Original language | English |
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Title of host publication | 13th IEEE Symposium on Computer Applications & Industrial Electronics 2023 |
Publisher | IEEE |
Pages | 268-273 |
Number of pages | 6 |
ISBN (Electronic) | 9798350347319 |
DOIs | |
Publication status | Published - 3 Jul 2023 |
Event | 13th IEEE Symposium on Computer Applications & Industrial Electronics 2023 - Penang, Malaysia Duration: 20 May 2023 → 21 May 2023 |
Conference
Conference | 13th IEEE Symposium on Computer Applications & Industrial Electronics 2023 |
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Abbreviated title | ISCAIE 2023 |
Country/Territory | Malaysia |
City | Penang |
Period | 20/05/23 → 21/05/23 |
Keywords
- Average number of observations to signal
- average time to signal
- control chart
- cumulative sum
- sequential probability ratio test
- statistical process control
ASJC Scopus subject areas
- Computer Science Applications
- Computer Networks and Communications
- Computer Vision and Pattern Recognition
- Information Systems and Management
- Statistics, Probability and Uncertainty
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering
- Instrumentation