Abstract
A carrier-frequency bridge method is described whereby rapid changes in electrical resistance can be studied with a time resolution of the order of fraction one-third ms and typical sensitivity of the order of 10 nO in a specimen of resistance of the order of 1mO.
| Original language | English |
|---|---|
| Article number | 313 |
| Pages (from-to) | 423-425 |
| Number of pages | 3 |
| Journal | Journal of Physics E: Scientific Instruments |
| Volume | 1 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 1968 |
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