A technique for measuring small, fast changes in resistance

D Anderson, J. M. Anderson, A. H. Seville

Research output: Contribution to journalArticlepeer-review

Abstract

A carrier-frequency bridge method is described whereby rapid changes in electrical resistance can be studied with a time resolution of the order of fraction one-third ms and typical sensitivity of the order of 10 nO in a specimen of resistance of the order of 1mO.

Original languageEnglish
Article number313
Pages (from-to)423-425
Number of pages3
JournalJournal of Physics E: Scientific Instruments
Volume1
Issue number4
DOIs
Publication statusPublished - 1968

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