A synthetic revised m-of-k runs rules control chart

Zhi Lin Chong, Michael Boon Chong Khoo, Sin Yin Teh, Wei Lin Teoh

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Control charts are commonly used for quality improvement in a manufacturing process. In this paper, we proposed a newer control chart, namely the synthetic revised m-of-k (R - m/k) runs rules chart to monitor the shift in the mean of a process. The newly proposed chart is obtained by integrating the R - m/k runs rules sub-chart and the conforming run length (CRL) sub-chart. The efficiency of a chart can be studied via the average run length (ARL) criterion. The out-of-control ARL result of the proposed chart is compared with its original counterparts, namely the synthetic and R - m/k runs rules charts, as well as the EWMA chart. The performance comparison indicates that the proposed synthetic R - m/k runs rules chart surpasses all the charts under comparison for detecting most sizes of the mean shifts. Therefore, the proposed synthetic R - m/k runs rules chart is a viable substitute for the standard synthetic and R - m/k runs rules charts. © 2015 IEEE.
Original languageEnglish
Title of host publication2015 International Conference on Research and Education in Mathematics
PublisherIEEE
Pages250-255
Number of pages6
ISBN (Electronic)9781467375061
DOIs
Publication statusPublished - 17 Dec 2015
Event2015 International Conference on Research and Education in Mathematics - Kuala Lumpur, Malaysia
Duration: 25 Aug 201527 Aug 2015

Conference

Conference2015 International Conference on Research and Education in Mathematics
Abbreviated titleICREM7 2015
CountryMalaysia
CityKuala Lumpur
Period25/08/1527/08/15

Keywords

  • average run length (ARL)
  • conforming run length (CRL)
  • control chart
  • runs rules
  • synthetic

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  • Cite this

    Chong, Z. L., Khoo, M. B. C., Teh, S. Y., & Teoh, W. L. (2015). A synthetic revised m-of-k runs rules control chart. In 2015 International Conference on Research and Education in Mathematics (pp. 250-255). IEEE. https://doi.org/10.1109/ICREM.2015.7357064