A synthetic revised m-of-k runs rules control chart

Zhi Lin Chong; Michael Boon Chong Khoo; Sin Yin Teh; Wei Lin Teoh

doi:10.1109/ICREM.2015.7357064

A synthetic revised m-of-k runs rules control chart

Zhi Lin Chong, Michael Boon Chong Khoo, Sin Yin Teh, Wei Lin Teoh

School of Mathematical & Computer Sciences

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Abstract

Control charts are commonly used for quality improvement in a manufacturing process. In this paper, we proposed a newer control chart, namely the synthetic revised m-of-k (R - m/k) runs rules chart to monitor the shift in the mean of a process. The newly proposed chart is obtained by integrating the R - m/k runs rules sub-chart and the conforming run length (CRL) sub-chart. The efficiency of a chart can be studied via the average run length (ARL) criterion. The out-of-control ARL result of the proposed chart is compared with its original counterparts, namely the synthetic and R - m/k runs rules charts, as well as the EWMA chart. The performance comparison indicates that the proposed synthetic R - m/k runs rules chart surpasses all the charts under comparison for detecting most sizes of the mean shifts. Therefore, the proposed synthetic R - m/k runs rules chart is a viable substitute for the standard synthetic and R - m/k runs rules charts. © 2015 IEEE.

Original language	English
Title of host publication	2015 International Conference on Research and Education in Mathematics
Publisher	IEEE
Pages	250-255
Number of pages	6
ISBN (Electronic)	9781467375061
DOIs	https://doi.org/10.1109/ICREM.2015.7357064
Publication status	Published - 17 Dec 2015
Event	2015 International Conference on Research and Education in Mathematics - Kuala Lumpur, Malaysia Duration: 25 Aug 2015 → 27 Aug 2015

Conference

Conference	2015 International Conference on Research and Education in Mathematics
Abbreviated title	ICREM7 2015
Country/Territory	Malaysia
City	Kuala Lumpur
Period	25/08/15 → 27/08/15

Keywords

average run length (ARL)
conforming run length (CRL)
control chart
runs rules
synthetic

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10.1109/ICREM.2015.7357064

Cite this

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title = "A synthetic revised m-of-k runs rules control chart",

abstract = "Control charts are commonly used for quality improvement in a manufacturing process. In this paper, we proposed a newer control chart, namely the synthetic revised m-of-k (R - m/k) runs rules chart to monitor the shift in the mean of a process. The newly proposed chart is obtained by integrating the R - m/k runs rules sub-chart and the conforming run length (CRL) sub-chart. The efficiency of a chart can be studied via the average run length (ARL) criterion. The out-of-control ARL result of the proposed chart is compared with its original counterparts, namely the synthetic and R - m/k runs rules charts, as well as the EWMA chart. The performance comparison indicates that the proposed synthetic R - m/k runs rules chart surpasses all the charts under comparison for detecting most sizes of the mean shifts. Therefore, the proposed synthetic R - m/k runs rules chart is a viable substitute for the standard synthetic and R - m/k runs rules charts. {\textcopyright} 2015 IEEE.",

keywords = "average run length (ARL), conforming run length (CRL), control chart, runs rules, synthetic",

author = "Chong, {Zhi Lin} and Khoo, {Michael Boon Chong} and Teh, {Sin Yin} and Teoh, {Wei Lin}",

year = "2015",

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TY - CHAP

T1 - A synthetic revised m-of-k runs rules control chart

AU - Chong, Zhi Lin

AU - Khoo, Michael Boon Chong

AU - Teh, Sin Yin

AU - Teoh, Wei Lin

PY - 2015/12/17

Y1 - 2015/12/17

N2 - Control charts are commonly used for quality improvement in a manufacturing process. In this paper, we proposed a newer control chart, namely the synthetic revised m-of-k (R - m/k) runs rules chart to monitor the shift in the mean of a process. The newly proposed chart is obtained by integrating the R - m/k runs rules sub-chart and the conforming run length (CRL) sub-chart. The efficiency of a chart can be studied via the average run length (ARL) criterion. The out-of-control ARL result of the proposed chart is compared with its original counterparts, namely the synthetic and R - m/k runs rules charts, as well as the EWMA chart. The performance comparison indicates that the proposed synthetic R - m/k runs rules chart surpasses all the charts under comparison for detecting most sizes of the mean shifts. Therefore, the proposed synthetic R - m/k runs rules chart is a viable substitute for the standard synthetic and R - m/k runs rules charts. © 2015 IEEE.

AB - Control charts are commonly used for quality improvement in a manufacturing process. In this paper, we proposed a newer control chart, namely the synthetic revised m-of-k (R - m/k) runs rules chart to monitor the shift in the mean of a process. The newly proposed chart is obtained by integrating the R - m/k runs rules sub-chart and the conforming run length (CRL) sub-chart. The efficiency of a chart can be studied via the average run length (ARL) criterion. The out-of-control ARL result of the proposed chart is compared with its original counterparts, namely the synthetic and R - m/k runs rules charts, as well as the EWMA chart. The performance comparison indicates that the proposed synthetic R - m/k runs rules chart surpasses all the charts under comparison for detecting most sizes of the mean shifts. Therefore, the proposed synthetic R - m/k runs rules chart is a viable substitute for the standard synthetic and R - m/k runs rules charts. © 2015 IEEE.

KW - average run length (ARL)

KW - conforming run length (CRL)

KW - control chart

KW - runs rules

KW - synthetic

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DO - 10.1109/ICREM.2015.7357064

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BT - 2015 International Conference on Research and Education in Mathematics

PB - IEEE

T2 - 2015 International Conference on Research and Education in Mathematics

Y2 - 25 August 2015 through 27 August 2015

ER -

A synthetic revised m-of-k runs rules control chart

Abstract

Conference

Keywords

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