A synthetic revised m-of-k runs rules control chart

Zhi Lin Chong, Michael Boon Chong Khoo, Sin Yin Teh, Wei Lin Teoh

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

Control charts are commonly used for quality improvement in a manufacturing process. In this paper, we proposed a newer control chart, namely the synthetic revised m-of-k (R - m/k) runs rules chart to monitor the shift in the mean of a process. The newly proposed chart is obtained by integrating the R - m/k runs rules sub-chart and the conforming run length (CRL) sub-chart. The efficiency of a chart can be studied via the average run length (ARL) criterion. The out-of-control ARL result of the proposed chart is compared with its original counterparts, namely the synthetic and R - m/k runs rules charts, as well as the EWMA chart. The performance comparison indicates that the proposed synthetic R - m/k runs rules chart surpasses all the charts under comparison for detecting most sizes of the mean shifts. Therefore, the proposed synthetic R - m/k runs rules chart is a viable substitute for the standard synthetic and R - m/k runs rules charts. © 2015 IEEE.
LanguageEnglish
Title of host publication2015 International Conference on Research and Education in Mathematics
PublisherIEEE
Pages250-255
Number of pages6
ISBN (Electronic)9781467375061
DOIs
Publication statusPublished - 17 Dec 2015
Event2015 International Conference on Research and Education in Mathematics - Kuala Lumpur, Malaysia
Duration: 25 Aug 201527 Aug 2015

Conference

Conference2015 International Conference on Research and Education in Mathematics
Abbreviated titleICREM7 2015
CountryMalaysia
CityKuala Lumpur
Period25/08/1527/08/15

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Control charts

Keywords

  • average run length (ARL)
  • conforming run length (CRL)
  • control chart
  • runs rules
  • synthetic

Cite this

Chong, Z. L., Khoo, M. B. C., Teh, S. Y., & Teoh, W. L. (2015). A synthetic revised m-of-k runs rules control chart. In 2015 International Conference on Research and Education in Mathematics (pp. 250-255). IEEE. https://doi.org/10.1109/ICREM.2015.7357064
Chong, Zhi Lin ; Khoo, Michael Boon Chong ; Teh, Sin Yin ; Teoh, Wei Lin. / A synthetic revised m-of-k runs rules control chart. 2015 International Conference on Research and Education in Mathematics. IEEE, 2015. pp. 250-255
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Chong, ZL, Khoo, MBC, Teh, SY & Teoh, WL 2015, A synthetic revised m-of-k runs rules control chart. in 2015 International Conference on Research and Education in Mathematics. IEEE, pp. 250-255, 2015 International Conference on Research and Education in Mathematics, Kuala Lumpur, Malaysia, 25/08/15. https://doi.org/10.1109/ICREM.2015.7357064

A synthetic revised m-of-k runs rules control chart. / Chong, Zhi Lin; Khoo, Michael Boon Chong; Teh, Sin Yin; Teoh, Wei Lin.

2015 International Conference on Research and Education in Mathematics. IEEE, 2015. p. 250-255.

Research output: Chapter in Book/Report/Conference proceedingChapter

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AU - Teoh, Wei Lin

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N2 - Control charts are commonly used for quality improvement in a manufacturing process. In this paper, we proposed a newer control chart, namely the synthetic revised m-of-k (R - m/k) runs rules chart to monitor the shift in the mean of a process. The newly proposed chart is obtained by integrating the R - m/k runs rules sub-chart and the conforming run length (CRL) sub-chart. The efficiency of a chart can be studied via the average run length (ARL) criterion. The out-of-control ARL result of the proposed chart is compared with its original counterparts, namely the synthetic and R - m/k runs rules charts, as well as the EWMA chart. The performance comparison indicates that the proposed synthetic R - m/k runs rules chart surpasses all the charts under comparison for detecting most sizes of the mean shifts. Therefore, the proposed synthetic R - m/k runs rules chart is a viable substitute for the standard synthetic and R - m/k runs rules charts. © 2015 IEEE.

AB - Control charts are commonly used for quality improvement in a manufacturing process. In this paper, we proposed a newer control chart, namely the synthetic revised m-of-k (R - m/k) runs rules chart to monitor the shift in the mean of a process. The newly proposed chart is obtained by integrating the R - m/k runs rules sub-chart and the conforming run length (CRL) sub-chart. The efficiency of a chart can be studied via the average run length (ARL) criterion. The out-of-control ARL result of the proposed chart is compared with its original counterparts, namely the synthetic and R - m/k runs rules charts, as well as the EWMA chart. The performance comparison indicates that the proposed synthetic R - m/k runs rules chart surpasses all the charts under comparison for detecting most sizes of the mean shifts. Therefore, the proposed synthetic R - m/k runs rules chart is a viable substitute for the standard synthetic and R - m/k runs rules charts. © 2015 IEEE.

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Chong ZL, Khoo MBC, Teh SY, Teoh WL. A synthetic revised m-of-k runs rules control chart. In 2015 International Conference on Research and Education in Mathematics. IEEE. 2015. p. 250-255 https://doi.org/10.1109/ICREM.2015.7357064