A study on the performances of the run sum X̄ chart under the gamma process

Kai Le Goh, Wei Lin Teoh*, Zhi Lin Chong, Kai Lin Ong, Laila El Ghandour

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

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Abstract

The run sum (RS) X̄ chart is known as a simple and powerful tool for monitoring the mean of a process. Most developments of the RS X̄ chart assume that the underlying process comes from a normal distribution. However, in practice, many processes tend to follow a non-normal distribution. These non-normal processes affect the performances of control charts under the design of normal distribution. In this paper, we present a detailed analysis on the performances of the RS X̄ chart when the underlying data come from a gamma distribution. By using Monte Carlo simulation approach, the run-length properties, namely the average run length and the standard deviation of the run length will be computed. Particularly, the 4 and 7 regions RS X̄ charts under both distributions are considered. When the charts’ parameters specifically designed for the normal distribution are used to monitor the data from a gamma distribution, simulated results show that RS X̄ charts’ performances are significantly deteriorated. The RS X̄ chart has higher false alarm rates when the underlying distribution is gamma.
Original languageEnglish
Article number01002
JournalITM Web of Conferences
Volume67
DOIs
Publication statusPublished - 21 Aug 2024

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