A study on the median run length performance of the run sum S control chart

Hao Gao , Michael Boon Chong Khoo, Sin Yin Teh, Wei Lin Teoh

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)
90 Downloads (Pure)

Abstract

Control charts play a very important role in Statistical Process Control. Run sum S control chart is sensitive in detecting small to moderate shifts. It is an excellent alternative to Shewhart control chart. The performance of the run sum S control chart based on median run length (MRL) performance is proposed in this study. The Statistical Analysis System (SAS) program was used to calculate the in-control ARL and in-control MRL for the nine run sum S chart schemes with different sample sizes, magnitude of shift in the process standard deviation, and the in-control run lengths. The findings show that the MRL measure provides better explanation than the ARL criterion. Moreover, the MRL performance of the run sum S chart schemes is substantially affected by the sample sizes, magnitude of shift in the process standard deviation, and the in-control run lengths.
Original languageEnglish
Pages (from-to)885-890
Number of pages6
JournalInternational Journal of Mechanical Engineering and Robotics Research
Volume8
Issue number6
DOIs
Publication statusPublished - Nov 2019

ASJC Scopus subject areas

  • General Mathematics
  • General Engineering

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