TY - JOUR
T1 - A statistical approach to scaling up of CIGS PV cells: Quantitative analysis of composition uniformity within and between the samples
AU - Bae, Dowon
N1 - Funding Information:
Dowon Bae reports financial support was provided by Heriot-Watt University School of Engineering and Physical Sciences. Dowon Bae reports financial support was provided by Korea Institute of Energy Technology Evaluation and Planning. Dowon Bae reports a relationship with LG Innotek that includes: employment. Corresponding author, Dowon Bae, previously employeed by LG Innotek.This work was supported by the Korea Institute of Energy Technology Evaluation and Planning (KETEP) grant funded by the Ministry of Knowledge Economy, the Republic of Korea (No. 20113020010050). The author would especially like to thank Heriot-Watt University for start-up funding. Acknowledgements are also extended to Sehan Kwon (SK Hynix) and JinWoo Lee (Velo Solar) for their scientific and technical advice for this report. The author also thanks Chul-Hwan Choi (Volvo) for his assistance with the TCO layer fabrication process.
Funding Information:
This work was supported by the Korea Institute of Energy Technology Evaluation and Planning (KETEP) grant funded by the Ministry of Knowledge Economy, the Republic of Korea (No. 20113020010050 ). The author would especially like to thank Heriot-Watt University for start-up funding. Acknowledgements are also extended to Sehan Kwon (SK Hynix) and JinWoo Lee (Velo Solar) for their scientific and technical advice for this report. The author also thanks Chul-Hwan Choi (Volvo) for his assistance with the TCO layer fabrication process.
Publisher Copyright:
© 2023 The Author
PY - 2023/9
Y1 - 2023/9
N2 - Tremendous efforts have been made toward large-area Cu(In,Ga)Se2-based photovoltaic module fabrication with some successful commercialisation cases using a co-evaporation system. However, comprehensive implementation of the technology has been hindered due to the technological difficulties in film uniformity for scaled-up deposition. However, the quantitative impact analysis on these topics is a matter of commercial confidentiality, and it has not been possible to provide precise accounts of the processes currently used. In this technical report, an attempt has been made to statistically identify the quantitative impact of the uniformity of Cu(In,Ga)Se2 layer on the J-V characteristics of the large-area panels (120 cm × 60 cm) fabricated from a pilot in-line evaporation system. Given the assumption that reproducibility for the other process steps is high, the results deliver important grounds for setting the control limits of the compositional uniformity for quality assurance towards a highly efficient CIGS PV manufacturing line.
AB - Tremendous efforts have been made toward large-area Cu(In,Ga)Se2-based photovoltaic module fabrication with some successful commercialisation cases using a co-evaporation system. However, comprehensive implementation of the technology has been hindered due to the technological difficulties in film uniformity for scaled-up deposition. However, the quantitative impact analysis on these topics is a matter of commercial confidentiality, and it has not been possible to provide precise accounts of the processes currently used. In this technical report, an attempt has been made to statistically identify the quantitative impact of the uniformity of Cu(In,Ga)Se2 layer on the J-V characteristics of the large-area panels (120 cm × 60 cm) fabricated from a pilot in-line evaporation system. Given the assumption that reproducibility for the other process steps is high, the results deliver important grounds for setting the control limits of the compositional uniformity for quality assurance towards a highly efficient CIGS PV manufacturing line.
KW - CIGS
KW - Evaporation
KW - Film uniformity
KW - In-line production
KW - PV panel
UR - http://www.scopus.com/inward/record.url?scp=85160306011&partnerID=8YFLogxK
U2 - 10.1016/j.mssp.2023.107626
DO - 10.1016/j.mssp.2023.107626
M3 - Article
SN - 1369-8001
VL - 164
JO - Materials Science in Semiconductor Processing
JF - Materials Science in Semiconductor Processing
M1 - 107626
ER -
