Abstract
Function approximation by artificial neural networks (ANNs) are often carried out via a collocation grid approach. However, for certain combinations of grids and functions, the training data for the relevant ANN can be extremely skewed and hence affect training efficiency, thereby necessitating standardization or normalization techniques. The choice of collocation grids often allows uniform training features but not targets. In this paper, we contribute a comparison between methods of target standardization - the relatively common min-max, z score, normalized log methods and the uncommon empirical cumulative distribution function (CDF) method - in terms of the resulting approximation capabilities of the ANNs using the standardized target values. We demonstrate that the empirical CDF is a general and robust standardization method that allows for efficient training and good approximations insituations of extreme target skewness. Novel modifications using a mix of true CDF and empirical CDF in standardizing targets are used to successfully reduce biases arising from the empirical CDF standardization method.
Original language | English |
---|---|
Title of host publication | 13th IEEE Symposium on Computer Applications & Industrial Electronics 2023 |
Publisher | IEEE |
Pages | 250-255 |
Number of pages | 6 |
ISBN (Electronic) | 9798350347319 |
DOIs | |
Publication status | Published - 3 Jul 2023 |
Event | 13th IEEE Symposium on Computer Applications & Industrial Electronics 2023 - Penang, Malaysia Duration: 20 May 2023 → 21 May 2023 |
Conference
Conference | 13th IEEE Symposium on Computer Applications & Industrial Electronics 2023 |
---|---|
Abbreviated title | ISCAIE 2023 |
Country/Territory | Malaysia |
City | Penang |
Period | 20/05/23 → 21/05/23 |
Keywords
- Artificial Neural Networks
- Cumulative Distribution Functions
- Forward Problems
- Function Approximation
- Machine Learning
- Target Standardization
ASJC Scopus subject areas
- Computer Science Applications
- Computer Networks and Communications
- Computer Vision and Pattern Recognition
- Information Systems and Management
- Statistics, Probability and Uncertainty
- Electrical and Electronic Engineering
- Industrial and Manufacturing Engineering
- Instrumentation