A novel STM-based depth profiling technique for the electronic characterisation of thin film materials

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Cite this

@article{d5739bc8d52845a683f3501b69f29857,

title = "A novel STM-based depth profiling technique for the electronic characterisation of thin film materials",

author = "Y Fan and Fitzgerald, \{A G\} and Cairns, \{J A\} and Wilson, \{John Ivor Barrett\}",

year = "2000",

language = "English",

volume = "162",

pages = "630--637",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier B.V.",

}