A novel STM-based depth profiling technique for the electronic characterisation of thin film materials

Y Fan, A G Fitzgerald, J A Cairns, John Ivor Barrett Wilson

Research output: Contribution to journal › Article › peer-review

Cite this

@article{d5739bc8d52845a683f3501b69f29857,

title = "A novel STM-based depth profiling technique for the electronic characterisation of thin film materials",

author = "Y Fan and Fitzgerald, {A G} and Cairns, {J A} and Wilson, {John Ivor Barrett}",

year = "2000",

language = "English",

volume = "162",

pages = "630--637",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier",

}