A novel STM-based depth profiling technique for the electronic characterisation of thin film materials

Y Fan, A G Fitzgerald, J A Cairns, John Ivor Barrett Wilson

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)630-637
Number of pages8
JournalApplied Surface Science
Volume162
Publication statusPublished - 2000

Cite this

Fan, Y., Fitzgerald, A. G., Cairns, J. A., & Wilson, J. I. B. (2000). A novel STM-based depth profiling technique for the electronic characterisation of thin film materials. Applied Surface Science, 162, 630-637.
Fan, Y ; Fitzgerald, A G ; Cairns, J A ; Wilson, John Ivor Barrett. / A novel STM-based depth profiling technique for the electronic characterisation of thin film materials. In: Applied Surface Science. 2000 ; Vol. 162. pp. 630-637.
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journal = "Applied Surface Science",
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A novel STM-based depth profiling technique for the electronic characterisation of thin film materials. / Fan, Y; Fitzgerald, A G; Cairns, J A; Wilson, John Ivor Barrett.

In: Applied Surface Science, Vol. 162, 2000, p. 630-637.

Research output: Contribution to journalArticle

TY - JOUR

T1 - A novel STM-based depth profiling technique for the electronic characterisation of thin film materials

AU - Fan, Y

AU - Fitzgerald, A G

AU - Cairns, J A

AU - Wilson, John Ivor Barrett

PY - 2000

Y1 - 2000

M3 - Article

VL - 162

SP - 630

EP - 637

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

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