A novel STM-based depth profiling technique for the electronic characterisation of thin film materials

Y Fan, A G Fitzgerald, J A Cairns, John Ivor Barrett Wilson

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)630-637
Number of pages8
JournalApplied Surface Science
Volume162
Publication statusPublished - 2000

Cite this

Fan, Y., Fitzgerald, A. G., Cairns, J. A., & Wilson, J. I. B. (2000). A novel STM-based depth profiling technique for the electronic characterisation of thin film materials. Applied Surface Science, 162, 630-637.