A High-Temperature Diffraction-Resistance Study of Chalcopyrite, CuFeS2

The electrical, magnetic and structural properties of synthetic chalcopyrite, CuFeS2, have been studied up to 873 K using DC resistance measurements performed in-situ during neutron powder diffraction experiments. Under ambient conditions the material adopts the accepted structural model for CuFeS2 in the space group I4¯2d, with the magnetic moment of the Fe3+ cations aligned along [001]. The electrical resistivity is around 0.3 O cm under ambient conditions, consistent with semiconductor character, and decreases slightly with increase in temperature until a more abrupt fall occurs in the region 750–800 K. This abrupt change in resistivity is accompanied by a structural transition to a cubic zinc blende structured phase (space group F4¯3m) in which Cu+ and Fe3+ cations are disordered over the same tetrahedral crystallographic sites and by a simultaneous loss of long-range magnetic order. The implications of these results are discussed in the context of previous studies of the chalcopyrite system.