Abstract
The Shewhart X control chart is a useful process monitoring tool in manufacturing industries to detect the presence of assignable causes. However, it is insensitive in detecting small process shifts. To circumvent this problem, adaptive control charts are suggested. An adaptive chart enables at least one of the chart's parameters to be adjusted to increase the chart's sensitivity. Two common adaptive charts that exist in the literature are the double sampling (DS) X and variable sampling interval (VSI) X charts. This paper compares the performances of the DS X and VSI X charts, based on the average time to signal (ATS) criterion. The ATS profiles of the DS X and VSI X charts are obtained using the Mathematica and Statistical Analysis System (SAS) programs, respectively. The results show that the VSI X chart is generally superior to the DS X chart.
Original language | English |
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Title of host publication | Proceedings of 2016 IEEE International Conference on Control and Robotics Engineering |
Publisher | IEEE |
ISBN (Electronic) | 978-1-5090-0832-2 |
ISBN (Print) | 9781509008315 |
DOIs | |
Publication status | Published - May 2016 |
Event | 2016 IEEE International Conference on Control and Robotics Engineering - Singapore, Singapore Duration: 2 Apr 2016 → 4 Apr 2016 |
Conference
Conference | 2016 IEEE International Conference on Control and Robotics Engineering |
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Abbreviated title | ICCRE 2016 |
Country/Territory | Singapore |
City | Singapore |
Period | 2/04/16 → 4/04/16 |
Keywords
- Adaptive charts
- Average Time to Signal
- Double sampling
- Variable sampling interval
- X charts
ASJC Scopus subject areas
- Artificial Intelligence
- Control and Systems Engineering