A comparative study between the variable sampling interval X and Double Sampling X Charts

Michael Boon Chong Khoo, J. L. Khoo, W. C. Yeong, W. L. Teoh

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The Shewhart X control chart is a useful process monitoring tool in manufacturing industries to detect the presence of assignable causes. However, it is insensitive in detecting small process shifts. To circumvent this problem, adaptive control charts are suggested. An adaptive chart enables at least one of the chart's parameters to be adjusted to increase the chart's sensitivity. Two common adaptive charts that exist in the literature are the double sampling (DS) X and variable sampling interval (VSI) X charts. This paper compares the performances of the DS X and VSI X charts, based on the average time to signal (ATS) criterion. The ATS profiles of the DS X and VSI X charts are obtained using the Mathematica and Statistical Analysis System (SAS) programs, respectively. The results show that the VSI X chart is generally superior to the DS X chart.

Original languageEnglish
Title of host publicationProceedings of 2016 IEEE International Conference on Control and Robotics Engineering
PublisherIEEE
ISBN (Electronic)978-1-5090-0832-2
ISBN (Print)9781509008315
DOIs
Publication statusPublished - May 2016
Event2016 IEEE International Conference on Control and Robotics Engineering - Singapore, Singapore
Duration: 2 Apr 20164 Apr 2016

Conference

Conference2016 IEEE International Conference on Control and Robotics Engineering
Abbreviated titleICCRE 2016
CountrySingapore
CitySingapore
Period2/04/164/04/16

Keywords

  • Adaptive charts
  • Average Time to Signal
  • Double sampling
  • Variable sampling interval
  • X charts

ASJC Scopus subject areas

  • Artificial Intelligence
  • Control and Systems Engineering

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