Abstract
Rietveld profile analysis, simultaneously incorporating powder X-ray diffraction data and time-of-flight powder neutron diffraction data, has been used to establish unambiguously the distribution of chromium and vanadium cations in the ternary sulphide VCr2S4. The structure so determined, which is intermediate between the normal and inverse Cr3S4 structures, has vanadium cations evenly distributed between two sites.
Original language | English |
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Pages (from-to) | 831-836 |
Number of pages | 6 |
Journal | Materials Science Forum |
Volume | 228-231 |
Issue number | PART 2 |
Publication status | Published - 1996 |
Keywords
- Metal Sulphides
- Neutron Diffraction
- Rietveld Analysis
- X-ray Diffraction