A combined powder X-ray/neutron diffraction study of cation distributions in the ternary sulphide VCr2S4

A. V. Powell, D. C. Colgan

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Rietveld profile analysis, simultaneously incorporating powder X-ray diffraction data and time-of-flight powder neutron diffraction data, has been used to establish unambiguously the distribution of chromium and vanadium cations in the ternary sulphide VCr2S4. The structure so determined, which is intermediate between the normal and inverse Cr3S4 structures, has vanadium cations evenly distributed between two sites.

Original languageEnglish
Pages (from-to)831-836
Number of pages6
JournalMaterials Science Forum
Volume228-231
Issue numberPART 2
Publication statusPublished - 1996

Keywords

  • Metal Sulphides
  • Neutron Diffraction
  • Rietveld Analysis
  • X-ray Diffraction

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