A combined powder X-ray/neutron diffraction study of cation distributions in the ternary sulphide VCr2S4

A. V. Powell; D. C. Colgan

A combined powder X-ray/neutron diffraction study of cation distributions in the ternary sulphide VCr₂S₄

A. V. Powell, D. C. Colgan

School of Engineering & Physical Sciences

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

Rietveld profile analysis, simultaneously incorporating powder X-ray diffraction data and time-of-flight powder neutron diffraction data, has been used to establish unambiguously the distribution of chromium and vanadium cations in the ternary sulphide VCr₂S₄. The structure so determined, which is intermediate between the normal and inverse Cr₃S₄ structures, has vanadium cations evenly distributed between two sites.

Original language	English
Pages (from-to)	831-836
Number of pages	6
Journal	Materials Science Forum
Volume	228-231
Issue number	PART 2
Publication status	Published - 1996

Keywords

Metal Sulphides
Neutron Diffraction
Rietveld Analysis
X-ray Diffraction

Cite this

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title = "A combined powder X-ray/neutron diffraction study of cation distributions in the ternary sulphide VCr2S4",

abstract = "Rietveld profile analysis, simultaneously incorporating powder X-ray diffraction data and time-of-flight powder neutron diffraction data, has been used to establish unambiguously the distribution of chromium and vanadium cations in the ternary sulphide VCr2S4. The structure so determined, which is intermediate between the normal and inverse Cr3S4 structures, has vanadium cations evenly distributed between two sites.",

keywords = "Metal Sulphides, Neutron Diffraction, Rietveld Analysis, X-ray Diffraction",

author = "Powell, {A. V.} and Colgan, {D. C.}",

year = "1996",

language = "English",

volume = "228-231",

pages = "831--836",

journal = "Materials Science Forum",

issn = "0255-5476",

publisher = "Trans Tech Publications Ltd",

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TY - JOUR

T1 - A combined powder X-ray/neutron diffraction study of cation distributions in the ternary sulphide VCr2S4

AU - Powell, A. V.

AU - Colgan, D. C.

PY - 1996

Y1 - 1996

N2 - Rietveld profile analysis, simultaneously incorporating powder X-ray diffraction data and time-of-flight powder neutron diffraction data, has been used to establish unambiguously the distribution of chromium and vanadium cations in the ternary sulphide VCr2S4. The structure so determined, which is intermediate between the normal and inverse Cr3S4 structures, has vanadium cations evenly distributed between two sites.

AB - Rietveld profile analysis, simultaneously incorporating powder X-ray diffraction data and time-of-flight powder neutron diffraction data, has been used to establish unambiguously the distribution of chromium and vanadium cations in the ternary sulphide VCr2S4. The structure so determined, which is intermediate between the normal and inverse Cr3S4 structures, has vanadium cations evenly distributed between two sites.

KW - Metal Sulphides

KW - Neutron Diffraction

KW - Rietveld Analysis

KW - X-ray Diffraction

UR - http://www.scopus.com/inward/record.url?scp=0030403430&partnerID=8YFLogxK

M3 - Article

SN - 0255-5476

VL - 228-231

SP - 831

EP - 836

JO - Materials Science Forum

JF - Materials Science Forum

IS - PART 2

ER -

A combined powder X-ray/neutron diffraction study of cation distributions in the ternary sulphide VCr₂S₄

Abstract

Keywords

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