A 3D contact analysis approach for the visualization of the electrical contact asperities

Constantinos Roussos, Jonathan Swingler

Research output: Contribution to journalArticle

Original languageEnglish
JournalAIP Advances
Volume7
Issue number1
Early online date11 Jan 2017
DOIs
StatePublished - Jan 2017

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Roussos, Constantinos; Swingler, Jonathan / A 3D contact analysis approach for the visualization of the electrical contact asperities.

In: AIP Advances, Vol. 7, No. 1, 01.2017.

Research output: Contribution to journalArticle

@article{b2321b3decb242ca962235f86ddd7629,
title = "A 3D contact analysis approach for the visualization of the electrical contact asperities",
author = "Constantinos Roussos and Jonathan Swingler",
year = "2017",
month = "1",
doi = "10.1063/1.4974151",
volume = "7",
journal = "AIP Advances",
issn = "2158-3226",
publisher = "American Institute of Physics Publising LLC",
number = "1",

}

A 3D contact analysis approach for the visualization of the electrical contact asperities. / Roussos, Constantinos; Swingler, Jonathan.

In: AIP Advances, Vol. 7, No. 1, 01.2017.

Research output: Contribution to journalArticle

TY - JOUR

T1 - A 3D contact analysis approach for the visualization of the electrical contact asperities

AU - Roussos,Constantinos

AU - Swingler,Jonathan

PY - 2017/1

Y1 - 2017/1

U2 - 10.1063/1.4974151

DO - 10.1063/1.4974151

M3 - Article

VL - 7

JO - AIP Advances

T2 - AIP Advances

JF - AIP Advances

SN - 2158-3226

IS - 1

ER -