70nm resolution in sub-surface two-photon optical beam induced current microscopy through pupil-function engineering in the vectorial focusing regime

K. A. Serrels, E. Ramsay, D. T. Reid

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present experimental evidence for the resolution-enhancing effect of an annular pupil-plane aperture in two-photon semiconductor microscopy in the vectorial-focusing regime. At an illumination wavelength of 1550nm we achieved a resolution of 70nm (?/22). © 2009 Optical Society of America.

Original languageEnglish
Title of host publication2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009
Publication statusPublished - 2009
EventConference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference - Baltimore, Baltimore, MD, Moldova, Republic of
Duration: 2 Jun 20094 Jun 2009

Conference

ConferenceConference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference
Abbreviated titleCLEO/QELS 2009
CountryMoldova, Republic of
CityBaltimore, MD
Period2/06/094/06/09

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    Serrels, K. A., Ramsay, E., & Reid, D. T. (2009). 70nm resolution in sub-surface two-photon optical beam induced current microscopy through pupil-function engineering in the vectorial focusing regime. In 2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009