256×256, 100kfps, 61% Fill-factor time-resolved SPAD image sensor for microscopy applications

Istvan Gyongy, N. Calder, Amy Davies, Neale A. W. Dutton, Paul A. Dalgarno, Rory R. Duncan, Colin Rickman, R. K. Henderson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A 256×256 Single Photon Avalanche Diode (SPAD) image sensor operating at 100kfps with fill factor of 61% and pixel pitch of 16μm is reported. An all-NMOS 7T pixel allows high uniformity gated operation down to 4ns and ∼600ps fall time with on-chip delay generation. The sensor operates with 0.996 temporal aperture ratio (TAR) in rolling shutter and has a parasitic light sensitivity (PLS) in excess of -160dB when operated in global shutter. Gating and cooling allow the suppression of dark noise, which, in combination with the high fill factor, enables competitive low-light performance with electron multiplying CCDs (EMCCDs) whilst offering time-resolved imaging modes.

Original languageEnglish
Title of host publication2016 IEEE International Electron Devices Meeting (IEDM)
PublisherIEEE
Pages8.2.1-8.2.4
Number of pages4
ISBN (Electronic)9781509039029
DOIs
StatePublished - 2 Feb 2017
Event62nd IEEE International Electron Devices Meeting 2016 - San Francisco, United States

Publication series

NameTechnical digest
PublisherIEEE
ISSN (Print)2156-017X

Conference

Conference62nd IEEE International Electron Devices Meeting 2016
Abbreviated titleIEDM 2016
CountryUnited States
CitySan Francisco
Period3/12/167/12/16

Fingerprint

Avalanche diodes
Image sensors
Photons
Pixels
Photosensitivity
Charge coupled devices
Microscopic examination
Cooling
Imaging techniques
Electrons
Sensors

Cite this

Gyongy, I., Calder, N., Davies, A., Dutton, N. A. W., Dalgarno, P. A., Duncan, R. R., ... Henderson, R. K. (2017). 256×256, 100kfps, 61% Fill-factor time-resolved SPAD image sensor for microscopy applications. In 2016 IEEE International Electron Devices Meeting (IEDM) (pp. 8.2.1-8.2.4). (Technical digest). IEEE. DOI: 10.1109/IEDM.2016.7838373

Gyongy, Istvan; Calder, N.; Davies, Amy; Dutton, Neale A. W.; Dalgarno, Paul A.; Duncan, Rory R.; Rickman, Colin; Henderson, R. K. / 256×256, 100kfps, 61% Fill-factor time-resolved SPAD image sensor for microscopy applications.

2016 IEEE International Electron Devices Meeting (IEDM). IEEE, 2017. p. 8.2.1-8.2.4 (Technical digest).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Gyongy, I, Calder, N, Davies, A, Dutton, NAW, Dalgarno, PA, Duncan, RR, Rickman, C & Henderson, RK 2017, 256×256, 100kfps, 61% Fill-factor time-resolved SPAD image sensor for microscopy applications. in 2016 IEEE International Electron Devices Meeting (IEDM). Technical digest, IEEE, pp. 8.2.1-8.2.4, 62nd IEEE International Electron Devices Meeting 2016, San Francisco, United States, 3-7 December. DOI: 10.1109/IEDM.2016.7838373

256×256, 100kfps, 61% Fill-factor time-resolved SPAD image sensor for microscopy applications. / Gyongy, Istvan; Calder, N.; Davies, Amy; Dutton, Neale A. W.; Dalgarno, Paul A.; Duncan, Rory R.; Rickman, Colin; Henderson, R. K.

2016 IEEE International Electron Devices Meeting (IEDM). IEEE, 2017. p. 8.2.1-8.2.4 (Technical digest).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Gyongy I, Calder N, Davies A, Dutton NAW, Dalgarno PA, Duncan RR et al. 256×256, 100kfps, 61% Fill-factor time-resolved SPAD image sensor for microscopy applications. In 2016 IEEE International Electron Devices Meeting (IEDM). IEEE. 2017. p. 8.2.1-8.2.4. (Technical digest). Available from, DOI: 10.1109/IEDM.2016.7838373