FEI / Philips XL30 environmental scanning electron microscope (ESEM), equipped with an Oxford Instruments X-Max 80mm energy dispersive x-ray (EDX) detector. Fitted with a tungsten (W) filament. Imaging via a range of secondary electron (SE), backscattered electron (BSE) detectors, and a Centaurus cathodoluminescence (CL) detector. This microscope can operate in high vacuum, low vacuum and full wet (ESEM) mode. The latter offers the potential to examine wet samples in their natural state, and the possibility to carry out dynamic experiments such as observations on water wettability of substrates. Also comes equipped with a pair of tensile-compression stages and a liquids microinjector.