CESEM: Quanta 650 FEG scanning electron microscope (SEM)

Facility/equipment: Equipment

  • LocationShow on map

    Institute of Petroleum Engineering EGIS Conoco Building, Rm C1-1 Heriot-Watt University Riccarton, Edinburgh EH14 4AS

    United Kingdom

Equipments Details


FEI Quant 650 FEG Scanning Electron Microscope (SEM), equipped with Oxford Instruments X-MaxN 150 mm energy dispersive x-ray detector.  This SEM can be operated in high vacuum, low vacuum and full environmental (ESEM) mode.  It can therefore image most materials and carry out elemental analysis, often with minimal sample preparation.  Available imaging detectors include secondary electron (SE), backscattered electron (BSE), cathodoluminescence (CL) and electron backscattered diffraction (EBSD).  The system is equipped with FEI's "MAPS" software which allows for the automated acquisition of large area high-resolution images, and the Oxford Instruments "Aztec" suite provides the possibility of acquiring elemental composition maps over large areas, elemental linescans and the ability to provide targeted particle analysis.


NameCESEM: Quanta 650 FEG scanning electron microscope (SEM)
Acquisition date1/09/12

Research technique

  • Characterisation & Measurement


Explore the research areas in which this equipment has been used. These labels are generated based on the related outputs. Together they form a unique fingerprint.