CESEM: Quanta 650 FEG scanning electron microscope (SEM)

Facility/equipment: Equipment

  • Location

    Institute of Petroleum Engineering EGIS Conoco Building, Rm C1-1 Heriot-Watt University Riccarton, Edinburgh EH14 4AS

    United Kingdom

Description

FEI Quant 650 FEG Scanning Electron Microscope (SEM), equipped with Oxford Instruments X-MaxN 150 mm energy dispersive x-ray detector.  This SEM can be operated in high vacuum, low vacuum and full environmental (ESEM) mode.  It can therefore image most materials and carry out elemental analysis, often with minimal sample preparation.  Available imaging detectors include secondary electron (SE), backscattered electron (BSE), cathodoluminescence (CL) and electron backscattered diffraction (EBSD).  The system is equipped with FEI's "MAPS" software which allows for the automated acquisition of large area high-resolution images, and the Oxford Instruments "Aztec" suite provides the possibility of acquiring elemental composition maps over large areas, elemental linescans and the ability to provide targeted particle analysis.

Details

NameCESEM: Quanta 650 FEG scanning electron microscope (SEM)
Acquisition date1/09/12

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electron
cathodoluminescence
image resolution
sample preparation
diffraction
software
energy
detector
analysis