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Using Variable Sampling Intervals in EWMA Control Charts for Effective Gamma Process Monitoring
Teoh, W. L.
(Invited speaker)
Activity
:
Talk or presentation
›
Invited talk
Period
3 Jan 2025
→
4 Jan 2025
Held at
The 9th International Conference on Information System Design and Intelligent Applications (ISDIA 2025)
Degree of Recognition
International
X