Two-photon Laser-assisted Device Alteration in CMOS Integrated Circuits Using Linearly, Circularly and Radially Polarised Light

Activity: Talk or presentation › Invited talk

Description

Invited talk at IPFA 2016 (the 23rd International Symposium of the Physical and Failure Analysis of Integrated Circuits)
Period20 Jul 2016
Event titleThe 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits
Event typeConference
LocationSingapore, SingaporeShow on map
Degree of RecognitionInternational

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